X.Sun
,
Z.J.Ding
,
H.M.Li
,
K.Salma
,
Z.M.Zhang
,
W.S.Tan
金属学报(英文版)
A Monte Carlo model considering the electron spin direction and spin asymmetry has been developed. The energy distribution of the secondary electron polarization and the primary energy dependence of the polarization from Fe are studied. The simulation results show that: (1) the intensity of the spin-up secondary electrons is larger thanvthat of thevspin-down secondary electrons, suggesting the secondary electrons are spin polarized; (2) the spin polarization of secondary electrons with nearly zero kinetic energy is higher than the average valance spin polarization, Pb=27 0.000000or Fe. With increasing kinetic energy, the spin polarization of the secondary electrons decreases to the value of Pu remaining constant at higher kinetic energies; (3) the spin polarization increases with an increase in the primary energy and reaches a saturation value at higher primary energy in both the Monte Carlo simulation and experimental results.
关键词:
spin polarization
,
null
,
null
K.Salma
,
Z.J.Ding
,
H.M.Li
,
Z.M.Zhang
金属学报(英文版)
The investigation of influence of surface effects on the energy spectra of electrons is essential for comprehensive understanding of electron-solid interactions as well as quantitative analysis. The accuracy of the analysis depends on the models for elastic and inelastic interactions. Electrons impinging on a solid or escaping from it suffer losses in the surface layer. The energy loss spectra therefore have contributions from surface excitations. The role of surface excitations is characterized by surface excitation parameter (SEP), which indicates the number of surface plasmons created by an electron crossing the surface. The imaginary part of complex self-energy of an electron is related to the energy.' loss cross section. SEP is numerically computed using self-energy formalism and compared with the results as described and calculated by different workers.
关键词:
surface plasmons
,
null
,
null
H.M.Li
,
Z.J.Ding
金属学报(英文版)
A new parallel Monte Carlo simulation method of secondary electron (SE) and backscattered electron images (BSE) of scanning electron microscopy (SEM) for a complex geometric structure has been developed. This paper describes briefly the simulation method and the modification to the conventional sampling method for the step length. Example simulation results have been obtained for several artificial structures.
关键词:
Monte Carlo
,
null
,
null
